Resumen
The films composed of (1-x) BiFeO3- (x) CoFe2O4 varying the concentration (x = 0, 0.1, 0.2 and 0.3) were deposited by spin coating on Pt substrate (Pt / TiO2 / SiO2 / Si) from of 0.05 molar concentration precursors solutions, which were obtained by sol-gel method. Thin films characterization was made, the structure and the magnetoelectric properties were studied using X-ray diffraction, leakage current, dielectric constant, fer-roelectric and ferromagnetic hysteresis curve. The XRD results show characteristic peaks with the formation of BiFeO3 and the growth of peaks belonging to CoFe2O4 with the increase of x. All samples reveal little leakage current, being the lowest of 10-10 A/cm2 for (0.8) BiFeO3- (0.2) CoFe2O4. The dielectric constant in-creased in the range from 102 Hz to 105 Hz then decreased due to dielectric relaxation, for all samples the dielectric loss is less than 4%. All fabricated films show remnants polarization and magnetization greater than 60 µC/cm2 and 30 emu/gr respectively.
| Título traducido de la contribución | Influence of cobalt ferrite on the magnetoelectric properties of thin films of bismuth ferrite deposited by spin coating |
|---|---|
| Idioma original | Español |
| Número de artículo | e-12546 |
| Publicación | Revista Materia |
| Volumen | 25 |
| N.º | 1 |
| DOI | |
| Estado | Publicada - 2020 |
Palabras clave
- Ferromagnetic and ferroelectric
- Films
- Magnetoelectric
Huella
Profundice en los temas de investigación de 'Influencia de la ferrita de cobalto en la propiedades magnetoeléctricas de las películas delgadas de ferrita de bismuto depositadas por spin coating'. En conjunto forman una huella única.Citar esto
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